Nanomagnetic behavior of fullerene thin films in Earth magnetic field in dark and under polarization light influences

Abstract

In this paper magnetic fields intensity of C-60 thin films of 60 nm and 100 nm thickness under the influence of polarization lights are presented. Two proton magnetometers; were used for measurements. Significant change of magnetic field intensity in range from 2.5 nT to 12.3 nT is identified as a difference of dark and polarization lights of 60 nm and 100 nm thin films thickness, respectively. Specific power density of polarization light was 40 MW/cm(2). Based on 200 measurement data average value of difference between magnetic intensity of C-60 thin films, with 60 nm and 100 nm thickness, after influence of polarization light, were 3.9 nT and 9.9 nT respectively.