Nanomagnetic behavior of fullerene thin films in Earth magnetic field in dark and under polarization light influences
Апстракт
In this paper magnetic fields intensity of C-60 thin films of 60 nm and 100 nm thickness under the influence of polarization lights are presented. Two proton magnetometers; were used for measurements. Significant change of magnetic field intensity in range from 2.5 nT to 12.3 nT is identified as a difference of dark and polarization lights of 60 nm and 100 nm thin films thickness, respectively. Specific power density of polarization light was 40 MW/cm(2). Based on 200 measurement data average value of difference between magnetic intensity of C-60 thin films, with 60 nm and 100 nm thickness, after influence of polarization light, were 3.9 nT and 9.9 nT respectively.
Кључне речи:
thin films / polarization light / nanotechnology / magnetism / fullerenesИзвор:
Journal of Nanoscience and Nanotechnology, 2005, 5, 10, 1660-1664Издавач:
- Amer Scientific Publishers, Valencia
DOI: 10.1166/jnn.2005.185
ISSN: 1533-4880
PubMed: 16245524
WoS: 000232129900009
Scopus: 2-s2.0-32944463169
Колекције
Институција/група
Mašinski fakultetTY - JOUR AU - Koruga, Đuro AU - Nikolić, A AU - Mihajlović, S. AU - Matija, Lidija PY - 2005 UR - https://machinery.mas.bg.ac.rs/handle/123456789/507 AB - In this paper magnetic fields intensity of C-60 thin films of 60 nm and 100 nm thickness under the influence of polarization lights are presented. Two proton magnetometers; were used for measurements. Significant change of magnetic field intensity in range from 2.5 nT to 12.3 nT is identified as a difference of dark and polarization lights of 60 nm and 100 nm thin films thickness, respectively. Specific power density of polarization light was 40 MW/cm(2). Based on 200 measurement data average value of difference between magnetic intensity of C-60 thin films, with 60 nm and 100 nm thickness, after influence of polarization light, were 3.9 nT and 9.9 nT respectively. PB - Amer Scientific Publishers, Valencia T2 - Journal of Nanoscience and Nanotechnology T1 - Nanomagnetic behavior of fullerene thin films in Earth magnetic field in dark and under polarization light influences EP - 1664 IS - 10 SP - 1660 VL - 5 DO - 10.1166/jnn.2005.185 ER -
@article{ author = "Koruga, Đuro and Nikolić, A and Mihajlović, S. and Matija, Lidija", year = "2005", abstract = "In this paper magnetic fields intensity of C-60 thin films of 60 nm and 100 nm thickness under the influence of polarization lights are presented. Two proton magnetometers; were used for measurements. Significant change of magnetic field intensity in range from 2.5 nT to 12.3 nT is identified as a difference of dark and polarization lights of 60 nm and 100 nm thin films thickness, respectively. Specific power density of polarization light was 40 MW/cm(2). Based on 200 measurement data average value of difference between magnetic intensity of C-60 thin films, with 60 nm and 100 nm thickness, after influence of polarization light, were 3.9 nT and 9.9 nT respectively.", publisher = "Amer Scientific Publishers, Valencia", journal = "Journal of Nanoscience and Nanotechnology", title = "Nanomagnetic behavior of fullerene thin films in Earth magnetic field in dark and under polarization light influences", pages = "1664-1660", number = "10", volume = "5", doi = "10.1166/jnn.2005.185" }
Koruga, Đ., Nikolić, A., Mihajlović, S.,& Matija, L.. (2005). Nanomagnetic behavior of fullerene thin films in Earth magnetic field in dark and under polarization light influences. in Journal of Nanoscience and Nanotechnology Amer Scientific Publishers, Valencia., 5(10), 1660-1664. https://doi.org/10.1166/jnn.2005.185
Koruga Đ, Nikolić A, Mihajlović S, Matija L. Nanomagnetic behavior of fullerene thin films in Earth magnetic field in dark and under polarization light influences. in Journal of Nanoscience and Nanotechnology. 2005;5(10):1660-1664. doi:10.1166/jnn.2005.185 .
Koruga, Đuro, Nikolić, A, Mihajlović, S., Matija, Lidija, "Nanomagnetic behavior of fullerene thin films in Earth magnetic field in dark and under polarization light influences" in Journal of Nanoscience and Nanotechnology, 5, no. 10 (2005):1660-1664, https://doi.org/10.1166/jnn.2005.185 . .