Extraction of parameters from I-V data for nonideal photodetectors: A comparative study
Апстракт
Parameters that characterize semiconductor devices are often determined with difficulty, and their values very frequently depend on the method used for measurements and analysis. The extraction of diode parameters from the obtained I-V measurements could be complicated by their dependence on the voltage and the presence of series resistance. Therefore, an interpretation of the experimental I-V data must be very carefully made. In this paper, some methods for obtaining diode parameters such as saturation current, ideality factor and series resistance are presented. An evaluation of these methods based on their application for the extraction of the relevant parameters of photodiodes is also performed. Some of the methods that produce reliable and reproducible results are evaluated based on the experimentally obtained results, and in the view of the complexity of the used methods and their limitations.
Кључне речи:
I-V data / extractions / evaluation of methods / diode parametersИзвор:
Materials Science Forum, 2005, 494, 83-88Издавач:
- Trans Tech Publications Ltd
DOI: 10.4028/0-87849-971-7.83
ISSN: 0255-5476
WoS: 000230985800015
Scopus: 2-s2.0-35248852876
Колекције
Институција/група
Mašinski fakultetTY - CONF AU - Vasić, Aleksandra AU - Osmokrović, Predrag AU - Lončar, B AU - Stanković, S PY - 2005 UR - https://machinery.mas.bg.ac.rs/handle/123456789/475 AB - Parameters that characterize semiconductor devices are often determined with difficulty, and their values very frequently depend on the method used for measurements and analysis. The extraction of diode parameters from the obtained I-V measurements could be complicated by their dependence on the voltage and the presence of series resistance. Therefore, an interpretation of the experimental I-V data must be very carefully made. In this paper, some methods for obtaining diode parameters such as saturation current, ideality factor and series resistance are presented. An evaluation of these methods based on their application for the extraction of the relevant parameters of photodiodes is also performed. Some of the methods that produce reliable and reproducible results are evaluated based on the experimentally obtained results, and in the view of the complexity of the used methods and their limitations. PB - Trans Tech Publications Ltd C3 - Materials Science Forum T1 - Extraction of parameters from I-V data for nonideal photodetectors: A comparative study EP - 88 SP - 83 VL - 494 DO - 10.4028/0-87849-971-7.83 ER -
@conference{ author = "Vasić, Aleksandra and Osmokrović, Predrag and Lončar, B and Stanković, S", year = "2005", abstract = "Parameters that characterize semiconductor devices are often determined with difficulty, and their values very frequently depend on the method used for measurements and analysis. The extraction of diode parameters from the obtained I-V measurements could be complicated by their dependence on the voltage and the presence of series resistance. Therefore, an interpretation of the experimental I-V data must be very carefully made. In this paper, some methods for obtaining diode parameters such as saturation current, ideality factor and series resistance are presented. An evaluation of these methods based on their application for the extraction of the relevant parameters of photodiodes is also performed. Some of the methods that produce reliable and reproducible results are evaluated based on the experimentally obtained results, and in the view of the complexity of the used methods and their limitations.", publisher = "Trans Tech Publications Ltd", journal = "Materials Science Forum", title = "Extraction of parameters from I-V data for nonideal photodetectors: A comparative study", pages = "88-83", volume = "494", doi = "10.4028/0-87849-971-7.83" }
Vasić, A., Osmokrović, P., Lončar, B.,& Stanković, S.. (2005). Extraction of parameters from I-V data for nonideal photodetectors: A comparative study. in Materials Science Forum Trans Tech Publications Ltd., 494, 83-88. https://doi.org/10.4028/0-87849-971-7.83
Vasić A, Osmokrović P, Lončar B, Stanković S. Extraction of parameters from I-V data for nonideal photodetectors: A comparative study. in Materials Science Forum. 2005;494:83-88. doi:10.4028/0-87849-971-7.83 .
Vasić, Aleksandra, Osmokrović, Predrag, Lončar, B, Stanković, S, "Extraction of parameters from I-V data for nonideal photodetectors: A comparative study" in Materials Science Forum, 494 (2005):83-88, https://doi.org/10.4028/0-87849-971-7.83 . .