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Circular mode AFM: a new mode for investigating nanotribology

dc.creatorNoel, Olivier
dc.creatorMazeran, Pierre-Emmanuel
dc.creatorEl-Kirat, Karim
dc.creatorNasrallah, Hussein
dc.creatorVencl, Aleksandar
dc.creatorKluza, Kamil
dc.date.accessioned2023-02-11T22:23:10Z
dc.date.available2023-02-11T22:23:10Z
dc.date.issued2015
dc.identifier.urihttps://machinery.mas.bg.ac.rs/handle/123456789/4343
dc.language.isoensr
dc.rightsrestrictedAccesssr
dc.rights.urihttps://creativecommons.org/licenses/by-nc/4.0/
dc.sourceProceedings of the International Tribology Conference (ITC 2015)sr
dc.subjectnanotribologysr
dc.subjectatomic force microscopy (AFM)sr
dc.subjectnanometrologysr
dc.subjectbiotechnologysr
dc.subjectwearsr
dc.subjectinstrumentationsr
dc.titleCircular mode AFM: a new mode for investigating nanotribologysr
dc.typeconferenceObjectsr
dc.rights.licenseBY-NCsr
dc.citation.epage549
dc.citation.rankM34
dc.citation.spage548
dc.identifier.rcubhttps://hdl.handle.net/21.15107/rcub_machinery_4343
dc.type.versionpublishedVersionsr


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