Exploring wear at the nanoscale with circular mode atomic force microscopy
Апстракт
The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quantitative measurements of the wear volume for determining wear laws. In this paper, we describe a new, effective, experimental methodology based on circular mode AFM, which generates high frequency, circular displacements of the contact. Under such conditions, the wear rate is significant and the drift of the piezoelectric actuator is limited. As a result, well-defined wear tracks are generated and an accurate computation of the wear volume is possible. Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al2O3 nanocomposite material used in industrial applications.
Кључне речи:
wear mechanisms / nanowear / image processing / composite materials / circular mode atomic force microscopyИзвор:
Beilstein Journal of Nanotechnology, 2017, 8, 2662-2668Издавач:
- Beilstein-Institut, Frankfurt Am Main
Финансирање / пројекти:
- COST [MP1303]
- Campus France through the program PHC Pavle Savic
- Развој триболошких микро/нано двокомпонентних и хибридних самоподмазујућих композита (RS-MESTD-Technological Development (TD or TR)-35021)
DOI: 10.3762/bjnano.8.266
ISSN: 2190-4286
PubMed: 29354338
WoS: 000419066200001
Scopus: 2-s2.0-85038025867
Колекције
Институција/група
Mašinski fakultetTY - JOUR AU - Noel, Olivier AU - Vencl, Aleksandar AU - Mazeran, Pierre-Emmanuel PY - 2017 UR - https://machinery.mas.bg.ac.rs/handle/123456789/2551 AB - The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quantitative measurements of the wear volume for determining wear laws. In this paper, we describe a new, effective, experimental methodology based on circular mode AFM, which generates high frequency, circular displacements of the contact. Under such conditions, the wear rate is significant and the drift of the piezoelectric actuator is limited. As a result, well-defined wear tracks are generated and an accurate computation of the wear volume is possible. Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al2O3 nanocomposite material used in industrial applications. PB - Beilstein-Institut, Frankfurt Am Main T2 - Beilstein Journal of Nanotechnology T1 - Exploring wear at the nanoscale with circular mode atomic force microscopy EP - 2668 SP - 2662 VL - 8 DO - 10.3762/bjnano.8.266 ER -
@article{ author = "Noel, Olivier and Vencl, Aleksandar and Mazeran, Pierre-Emmanuel", year = "2017", abstract = "The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quantitative measurements of the wear volume for determining wear laws. In this paper, we describe a new, effective, experimental methodology based on circular mode AFM, which generates high frequency, circular displacements of the contact. Under such conditions, the wear rate is significant and the drift of the piezoelectric actuator is limited. As a result, well-defined wear tracks are generated and an accurate computation of the wear volume is possible. Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al2O3 nanocomposite material used in industrial applications.", publisher = "Beilstein-Institut, Frankfurt Am Main", journal = "Beilstein Journal of Nanotechnology", title = "Exploring wear at the nanoscale with circular mode atomic force microscopy", pages = "2668-2662", volume = "8", doi = "10.3762/bjnano.8.266" }
Noel, O., Vencl, A.,& Mazeran, P.. (2017). Exploring wear at the nanoscale with circular mode atomic force microscopy. in Beilstein Journal of Nanotechnology Beilstein-Institut, Frankfurt Am Main., 8, 2662-2668. https://doi.org/10.3762/bjnano.8.266
Noel O, Vencl A, Mazeran P. Exploring wear at the nanoscale with circular mode atomic force microscopy. in Beilstein Journal of Nanotechnology. 2017;8:2662-2668. doi:10.3762/bjnano.8.266 .
Noel, Olivier, Vencl, Aleksandar, Mazeran, Pierre-Emmanuel, "Exploring wear at the nanoscale with circular mode atomic force microscopy" in Beilstein Journal of Nanotechnology, 8 (2017):2662-2668, https://doi.org/10.3762/bjnano.8.266 . .