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Karakterizacija kontaktnih sočiva na bazi nanomaterijala pomoću nanoprob mikroskopa atomskih sila
Characterization of nanomaterial-based contact lenses by atomic force microscopy
dc.creator | Mileusnić, Ivana | |
dc.creator | Đuričić, I. | |
dc.creator | Hut, Igor | |
dc.creator | Stamenković, Dragomir | |
dc.creator | Petrov, Ljubiša | |
dc.creator | Bojović, Božica | |
dc.creator | Koruga, Đuro | |
dc.date.accessioned | 2022-09-19T16:52:00Z | |
dc.date.available | 2022-09-19T16:52:00Z | |
dc.date.issued | 2012 | |
dc.identifier.issn | 1986-8669 | |
dc.identifier.uri | https://machinery.mas.bg.ac.rs/handle/123456789/1416 | |
dc.description.abstract | U ovom radu predstavljeno je komparativno ispitivanje topografskih karakteristika potencijalnog novog, fotoničnog nanomaterijala za izradu kontaktnih sočiva i komercijalnog materijala kontaktnih sočiva. Ispitivanje je rađeno mikroskopijom atomskih sila (eng. Atomic Force Microscopy, AFM) koja omogućava uvid u površinske strukture ispitivanog materijala na nanonivou. Korišćen je mikroskop atomskih sila, SPM-5200, firme JEOL iz Japana. Za skeniranje površine uzorka AFM koristi posebno dizajnirane fizičke sonde koje se sastoje od šiljka postavljenog na mikronosač (kantilever). Skeniranje površine zasniva se na prevlačenju sonde po površini uzorka i praćenja njene deformacije u cilju dobijanja slika topografije. Sonda korišćena u ovom radu nosi naziv NCS18/Co-Cr i proizvod je firme MikroMasch (Estonija). NCS18/Co-Cr je silicijumska sonda, sa vrhom u obliku konusa. Silicijumski vrh obložen je prevlakom od legure kobalt-hroma. Bazni, komercijalni, materijal kontaktnih sočiva u osnovi je izrađen od polimetilmetakrilata (PMMA), dok je fotonični nanomaterijal kombinacija baznog materijala i fulerena C60. Fulereni su upotrebljeni zbog njihovih dobrih transmisionih osobina u ultraljubičastom, vidljivom i bliskom infracrvenom spektru. Sva snimanja su obavljena na sobnoj temperaturi. Rezultati ispitivanja i komparacije topografije oba materijala prikazani su u radu. | SR |
dc.description.abstract | In this paper the comparative studies were conducted of the surface areas of nanophotonic contact lens and contact lens made from base material, measured by Nanoprobe Atomic Force Microscope. Nanoprobe atomic force microscopy (AFM) provides information on the size structure on nano scale level, the form of recorded structures (cavities), their distribution of the surface, and the total roughness of the scanned area. The atomic force microscope used in this study is a SPM-5200 of JEOL, Japan. AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. Images of the specimen surface are created by measuring the deflection of the cantilever. The cantilever used in this study is produced by MikroMasch (Estonia) by trade name NCS18/Co-Cr. This AFM probe is silicon etched probe tip that has conical shape. It is coated with Co and Cr layers. Images of surface topography were obtained for each type of contact lenses. The base material of contact lens was made from PMMA and the nanopho-tonic contact lens was made of fullerene doped PMMA. Fullerenes were used because of their good transitive characteristics in ultraviolet, visible and near infrared light spectrums. Measurements were done at room temperature. Results of topography for both materials are presented and compared. | EN |
dc.relation | info:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/45009/RS// | |
dc.rights | openAccess | |
dc.source | Contemporary materials | |
dc.subject | PMMA | SR |
dc.subject | nanofotonično kontaktno sočivo | SR |
dc.subject | kantilever | SR |
dc.subject | fuleren | SR |
dc.subject | AFM | SR |
dc.subject | PMMA | EN |
dc.subject | Nanophotonic contact lens | EN |
dc.subject | Fullerene | EN |
dc.subject | Cantilever | EN |
dc.subject | AFM | EN |
dc.title | Karakterizacija kontaktnih sočiva na bazi nanomaterijala pomoću nanoprob mikroskopa atomskih sila | SR |
dc.title | Characterization of nanomaterial-based contact lenses by atomic force microscopy | EN |
dc.type | article | |
dc.rights.license | ARR | |
dc.citation.epage | 183 | |
dc.citation.issue | 2 | |
dc.citation.other | 3(2): 177-183 | |
dc.citation.spage | 177 | |
dc.citation.volume | 3 | |
dc.identifier.doi | 10.7251/COMEN1202177M | |
dc.identifier.fulltext | http://machinery.mas.bg.ac.rs/bitstream/id/334/1413.pdf | |
dc.type.version | publishedVersion |