Karakterizacija materijala SPM tehnikom i njeno unapređenje primenom analize uticaja defekata sondi
SPM characterization of materals and its improvements by probe defects analysis
2019
Authors
Petrov, LjubišaContributors
Matija, LidijaVasić, Aleksandra
Sedmak, Aleksandar
Lazović, Goran
Stamenković, Dragomir
Doctoral thesis (Published version)
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Show full item recordAbstract
Jedna od najperspektivnijih tehnika za ispitivanje sastava, strukture i svojstava materijala je mikroskopija sondama za skeniranje (SPM), odnosno njene komponente mikroskopija tunelovanjem elektrona (STM) i mikroskopija atomskim silama (AFM). Ovim metodama se rutinski postiže nanometarska i atomska rezolucija. Posebno istaknuta prednost metode je da ne postoje ograničenja u smislu porekla i sastava uzoraka, te je moguće ispitivanje organskih i neorganskih materijala. Ova tehnika se primenjuje u savremenim multidisciplinarnim istraživanjima u oblasti medicine, farmacije, stomatologije, nauke o materijalima, itd, i to za ispitivanje bioloških uzoraka, hemijskih jedinjenja, farmaceutskih proizvoda, veštačkih tkiva, materijala za implantologiju, i svih ostalih materijala čija nanotehnološka svojstva imaju uticaj na primenu u navedenim naučnim oblastima. Međutim, snimci dobijeni pomoću AFM-a su samo aproksimacije površina uzoraka, jer sonde nemaju ni savršenu veličinu ni geometriju, usled č...ega dolazi do pojave artefakata koji se definišu kao karakteristike koje se pojavljuju na snimku a koje nisu prisutne na ispitivanom uzorku. Ovi efekti izazvani konvolucijom između sonde i uzorka mogu do izvesne mere da budu korigovani matematičkom manipulacijom topografskim podacima. Metodologija koja je u ovom radu korišćena se zasniva na algebri skupova i osnovnim alatima matematičke morfologije. Iskorišćeni su matematički algoritmi za “slepu rekonstrukciju” vrhova sondi, a potom je izvršena dekonvolucija, da bi se otkrili delovi površine uzorka koji u realnosti nisu bili dostupni. Granica realnog vrha sonde se izračunava iz slike pomoću morfoloških ograničenja koja su inherentna u procesu snimanja. Rezultat se dobija u vidu snimka rekonstruisane površine uzorka iz dobijenih snimaka, uz pomoć rekonstrukcije vrha sonde kojom je uzorak sniman.
One of the most perspective available technique for investigation of the composition, structure and properties of materials, is scanning probe microscopy (SPM), respectively its components scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The advantage of the method is that they have no restrictions related to origin and composition of the material, and its possibilities to investigate vide variety of materials. This technique is used in multidisciplinary research in the field of medicine, pharmacy, dentistry, material science, etc., for study of biological samples, chemical compounds, pharmaceutical products, artificial tissues, implantology materials, and all other materials that have nanotechnological impact on application in these scientific fields. However, images obtained by AFM represent only approximation of the sample surfaces. This is because the probes have not perfect size and geometry, which leads to the appearance of artifacts. They are defined as cha...racteristics that appear on the image and are not present on the sample. These effects caused by convolutions between the probe and sample can be corrected to a certain extent by mathematical manipulation of topographic data. The methodology used in this paper is based on algebra of sets, and basic tools of mathematical morphology. Mathematical algorithms for the "blind reconstruction" of the tip were used, and then in order to detect the parts of the sample surface which is not available in real-time scanning deconvolution was applied. The limit of the real probe tip is calculated from the image, using the morphological limitations inherent in the recording process. The result acuired as an image of the reconstructed surface out of the used images, with the reconstruction of the real tip.
Keywords:
SPM / sonde / postprocesuiranje / materijali / konvolucija / Karakterizacija / emulacija / artefakti / AFM / SPM / reconstruction / probes / postprocessing / materials / emulation / convolution / Characterization / artefacts / AFMSource:
2019Publisher:
- Univerzitet u Beogradu, Mašinski fakultet
Funding / projects:
- Development of methods and techniques for early diagnostic of cervical, colon, oral cavity cancer and melanoma based on a digital image and excitation-emission spectrum in visible and infrared domain (RS-MESTD-Integrated and Interdisciplinary Research (IIR or III)-41006)
URI
http://eteze.bg.ac.rs/application/showtheses?thesesId=7065https://nardus.mpn.gov.rs/handle/123456789/11735
https://fedorabg.bg.ac.rs/fedora/get/o:20693/bdef:Content/download
http://vbs.rs/scripts/cobiss?command=DISPLAY&base=70036&RID=515006371
https://machinery.mas.bg.ac.rs/handle/123456789/64
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Inovacioni centarTY - THES AU - Petrov, Ljubiša PY - 2019 UR - http://eteze.bg.ac.rs/application/showtheses?thesesId=7065 UR - https://nardus.mpn.gov.rs/handle/123456789/11735 UR - https://fedorabg.bg.ac.rs/fedora/get/o:20693/bdef:Content/download UR - http://vbs.rs/scripts/cobiss?command=DISPLAY&base=70036&RID=515006371 UR - https://machinery.mas.bg.ac.rs/handle/123456789/64 AB - Jedna od najperspektivnijih tehnika za ispitivanje sastava, strukture i svojstava materijala je mikroskopija sondama za skeniranje (SPM), odnosno njene komponente mikroskopija tunelovanjem elektrona (STM) i mikroskopija atomskim silama (AFM). Ovim metodama se rutinski postiže nanometarska i atomska rezolucija. Posebno istaknuta prednost metode je da ne postoje ograničenja u smislu porekla i sastava uzoraka, te je moguće ispitivanje organskih i neorganskih materijala. Ova tehnika se primenjuje u savremenim multidisciplinarnim istraživanjima u oblasti medicine, farmacije, stomatologije, nauke o materijalima, itd, i to za ispitivanje bioloških uzoraka, hemijskih jedinjenja, farmaceutskih proizvoda, veštačkih tkiva, materijala za implantologiju, i svih ostalih materijala čija nanotehnološka svojstva imaju uticaj na primenu u navedenim naučnim oblastima. Međutim, snimci dobijeni pomoću AFM-a su samo aproksimacije površina uzoraka, jer sonde nemaju ni savršenu veličinu ni geometriju, usled čega dolazi do pojave artefakata koji se definišu kao karakteristike koje se pojavljuju na snimku a koje nisu prisutne na ispitivanom uzorku. Ovi efekti izazvani konvolucijom između sonde i uzorka mogu do izvesne mere da budu korigovani matematičkom manipulacijom topografskim podacima. Metodologija koja je u ovom radu korišćena se zasniva na algebri skupova i osnovnim alatima matematičke morfologije. Iskorišćeni su matematički algoritmi za “slepu rekonstrukciju” vrhova sondi, a potom je izvršena dekonvolucija, da bi se otkrili delovi površine uzorka koji u realnosti nisu bili dostupni. Granica realnog vrha sonde se izračunava iz slike pomoću morfoloških ograničenja koja su inherentna u procesu snimanja. Rezultat se dobija u vidu snimka rekonstruisane površine uzorka iz dobijenih snimaka, uz pomoć rekonstrukcije vrha sonde kojom je uzorak sniman. AB - One of the most perspective available technique for investigation of the composition, structure and properties of materials, is scanning probe microscopy (SPM), respectively its components scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The advantage of the method is that they have no restrictions related to origin and composition of the material, and its possibilities to investigate vide variety of materials. This technique is used in multidisciplinary research in the field of medicine, pharmacy, dentistry, material science, etc., for study of biological samples, chemical compounds, pharmaceutical products, artificial tissues, implantology materials, and all other materials that have nanotechnological impact on application in these scientific fields. However, images obtained by AFM represent only approximation of the sample surfaces. This is because the probes have not perfect size and geometry, which leads to the appearance of artifacts. They are defined as characteristics that appear on the image and are not present on the sample. These effects caused by convolutions between the probe and sample can be corrected to a certain extent by mathematical manipulation of topographic data. The methodology used in this paper is based on algebra of sets, and basic tools of mathematical morphology. Mathematical algorithms for the "blind reconstruction" of the tip were used, and then in order to detect the parts of the sample surface which is not available in real-time scanning deconvolution was applied. The limit of the real probe tip is calculated from the image, using the morphological limitations inherent in the recording process. The result acuired as an image of the reconstructed surface out of the used images, with the reconstruction of the real tip. PB - Univerzitet u Beogradu, Mašinski fakultet T1 - Karakterizacija materijala SPM tehnikom i njeno unapređenje primenom analize uticaja defekata sondi T1 - SPM characterization of materals and its improvements by probe defects analysis UR - https://hdl.handle.net/21.15107/rcub_nardus_11735 ER -
@phdthesis{ author = "Petrov, Ljubiša", year = "2019", abstract = "Jedna od najperspektivnijih tehnika za ispitivanje sastava, strukture i svojstava materijala je mikroskopija sondama za skeniranje (SPM), odnosno njene komponente mikroskopija tunelovanjem elektrona (STM) i mikroskopija atomskim silama (AFM). Ovim metodama se rutinski postiže nanometarska i atomska rezolucija. Posebno istaknuta prednost metode je da ne postoje ograničenja u smislu porekla i sastava uzoraka, te je moguće ispitivanje organskih i neorganskih materijala. Ova tehnika se primenjuje u savremenim multidisciplinarnim istraživanjima u oblasti medicine, farmacije, stomatologije, nauke o materijalima, itd, i to za ispitivanje bioloških uzoraka, hemijskih jedinjenja, farmaceutskih proizvoda, veštačkih tkiva, materijala za implantologiju, i svih ostalih materijala čija nanotehnološka svojstva imaju uticaj na primenu u navedenim naučnim oblastima. Međutim, snimci dobijeni pomoću AFM-a su samo aproksimacije površina uzoraka, jer sonde nemaju ni savršenu veličinu ni geometriju, usled čega dolazi do pojave artefakata koji se definišu kao karakteristike koje se pojavljuju na snimku a koje nisu prisutne na ispitivanom uzorku. Ovi efekti izazvani konvolucijom između sonde i uzorka mogu do izvesne mere da budu korigovani matematičkom manipulacijom topografskim podacima. Metodologija koja je u ovom radu korišćena se zasniva na algebri skupova i osnovnim alatima matematičke morfologije. Iskorišćeni su matematički algoritmi za “slepu rekonstrukciju” vrhova sondi, a potom je izvršena dekonvolucija, da bi se otkrili delovi površine uzorka koji u realnosti nisu bili dostupni. Granica realnog vrha sonde se izračunava iz slike pomoću morfoloških ograničenja koja su inherentna u procesu snimanja. Rezultat se dobija u vidu snimka rekonstruisane površine uzorka iz dobijenih snimaka, uz pomoć rekonstrukcije vrha sonde kojom je uzorak sniman., One of the most perspective available technique for investigation of the composition, structure and properties of materials, is scanning probe microscopy (SPM), respectively its components scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The advantage of the method is that they have no restrictions related to origin and composition of the material, and its possibilities to investigate vide variety of materials. This technique is used in multidisciplinary research in the field of medicine, pharmacy, dentistry, material science, etc., for study of biological samples, chemical compounds, pharmaceutical products, artificial tissues, implantology materials, and all other materials that have nanotechnological impact on application in these scientific fields. However, images obtained by AFM represent only approximation of the sample surfaces. This is because the probes have not perfect size and geometry, which leads to the appearance of artifacts. They are defined as characteristics that appear on the image and are not present on the sample. These effects caused by convolutions between the probe and sample can be corrected to a certain extent by mathematical manipulation of topographic data. The methodology used in this paper is based on algebra of sets, and basic tools of mathematical morphology. Mathematical algorithms for the "blind reconstruction" of the tip were used, and then in order to detect the parts of the sample surface which is not available in real-time scanning deconvolution was applied. The limit of the real probe tip is calculated from the image, using the morphological limitations inherent in the recording process. The result acuired as an image of the reconstructed surface out of the used images, with the reconstruction of the real tip.", publisher = "Univerzitet u Beogradu, Mašinski fakultet", title = "Karakterizacija materijala SPM tehnikom i njeno unapređenje primenom analize uticaja defekata sondi, SPM characterization of materals and its improvements by probe defects analysis", url = "https://hdl.handle.net/21.15107/rcub_nardus_11735" }
Petrov, L.. (2019). Karakterizacija materijala SPM tehnikom i njeno unapređenje primenom analize uticaja defekata sondi. Univerzitet u Beogradu, Mašinski fakultet.. https://hdl.handle.net/21.15107/rcub_nardus_11735
Petrov L. Karakterizacija materijala SPM tehnikom i njeno unapređenje primenom analize uticaja defekata sondi. 2019;. https://hdl.handle.net/21.15107/rcub_nardus_11735 .
Petrov, Ljubiša, "Karakterizacija materijala SPM tehnikom i njeno unapređenje primenom analize uticaja defekata sondi" (2019), https://hdl.handle.net/21.15107/rcub_nardus_11735 .